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Standards [CURRENT]

XP X21-015 ; XP ISO/TS 24597:2011-07-01
Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness

Title (German)

Mikrobereichsanalyse - Rasterelektronenmikroskopie - Verfahren zur Ermittlung der Bildschärfe

Edition 2011-07-01
Original language French
Price from 157.80 €
Table of contents