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Standards [CURRENT]

NF C96-017-1 ; NF EN 62374-1:2011-06-01
Semiconductor devices - Part 1: time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Title (German)

Halbleiterbauelemente - Teil 1: Prüfung auf zeitabhängigen dielektrischen Durchbruch (TDDB) bei Isolationsschichten zwischen metallischen Leiterbahnen

Edition 2011-06-01
Original language French
Price from 105.40 €
Table of contents