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Standards [CURRENT]

SN EN 62374-1+CORR
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Title (German)

Halbleiterbauelemente - Teil 1: Prüfung auf zeitabhängigen dielektrischen Durchbruch (TDDB) bei Isolationsschichten zwischen metallischen Leiterbahnen

Edition 2011-04
Original language German
Price from 79.80 €
Table of contents