DIN EN 61000-4-20
; VDE 0847-4-20:2011-07
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides (IEC 61000-4-20:2010); German version EN 61000-4-20:2010
Elektromagnetische Verträglichkeit (EMV) - Teil 4-20: Prüf- und Messverfahren - Messung der Störaussendung und Störfestigkeit in transversal-elektromagnetischen (TEM-)Wellenleitern (IEC 61000-4-20:2010); Deutsche Fassung EN 61000-4-20:2010
Overview
This standard contains the German version of the European Standard EN 61000-4-20:2010 and is identical to the International Standard IEC 61000-4-20:2010. It relates to emission and immunity test methods for electrical and electronic equipment in relation to high frequency electromagnetic fields using various types of transverse electromagnetic (TEM) waveguides. They include open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. Equipment under test that shall be tested in TEM waveguides must be small and no lines shall be connected to them. In relation to the previous standard the text was re-structured and the clauses 7 to 9 and a new informative annex concerning the calibration of field probes was added, amongst others. The responsible Committee is Subcommittee UK 767.3 "Hochfrequente Störgrößen" ("High frequency disturbances") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.
