DIN EN 62132-2
; VDE 0847-22-2:2011-07
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010); German version EN 62132-2:2011
Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit - Teil 2: Messung der Störfestigkeit bei Einstrahlungen - TEM-Zellen- und Breitband-TEM-Zellenverfahren (IEC 62132-2:2010); Deutsche Fassung EN 62132-2:2011
Overview
This International Standard specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell. A TEM cell is an enclosed TEM waveguide, often a rectangular coaxial line, in which a wave is propagated in the transverse electromagnetic mode to produce a specific field for testing purposes; the outer conductor completely encloses the inner conductor. This method has been developed to predict the risk of the electromagnetic disturbance of integrated circuits under the influence of high-frequency fields. Future standards of this series carry the new general title indicated and are incorporated as a measurement regulation for EMC into the corresponding series with the VDE classification 0847-22. The title of the existing standards of this series are updated with the next edition and those are then also incorporated with the VDE Classification 0847-22 into the VDE regulations. The responsible Committee is K 631 "Halbleiterbauelemente" ("Semiconductor devices") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.
Document: references other documents
Document: referenced in other documents
Responsible national committee
DKE/K 631 - Halbleiterbauelemente
