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Standards [CURRENT]

BS EN 62374-1
Semiconductor devices. Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Title (German)

Halbleiterbauelemente. Prüfung auf zeitabhängigen dielektrischen Durchbruch (TDDB) bei Isolationsschichten zwischen metallischen Leiterbahnen

Edition 2010-12-31
Original language English
Price from 192.70 €
Table of contents