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Standards [CURRENT]

OEVE/OENORM EN 62416
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010) (german version)

Title (German)

Halbleiterbauelemente - Hot-Carrier-Prüfverfahren für MOS-Transistoren (IEC 62416:2010) (deutsche Fassung)

Edition 2011-01-01
Original language German
Price from 100.28 €
Table of contents