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Standards [CURRENT]

OEVE/OENORM EN 62417
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010) (german version)

Title (German)

Halbleiterbauelemente - Prüfverfahren auf mobile Ionen für Feldeffekttransistoren mit Metall-Oxid-Halbleiter (MOSFET) (IEC 62417:2010) (deutsche Fassung)

Edition 2011-01-01
Original language German
Price from 76.61 €
Table of contents