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Standards [CURRENT]

NF C80-203 ; NF EN 62417:2010-11-01
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

Title (German)

Halbleiterbauelemente - Prüfverfahren auf mobile Ionen für Feldeffekttransistoren mit Metall-Oxid-Halbleiter (MOSFET)

Edition 2010-11-01
Original language French
Price from 73.40 €
Table of contents