DIN EN 61967-6 Berichtigung 1
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:2008-10; (IEC-Cor. :2010 to IEC 61967-6:2002)
Integrierte Schaltungen - Messung von elektromagnetischen Aussendungen im Frequenzbereich von 150 kHz bis 1 GHz - Teil 6: Messung der leitungsgeführten Aussendungen - Magnetsondenverfahren (IEC 61967-6:2002 + A1:2008); Deutsche Fassung EN 61967-6:2002 + A1:2008, Berichtigung zu DIN EN 61967-6:2008-10; (IEC-Cor. :2010 zu IEC 61967-6:2002)
Overview
Due to the International Corrigendum (IEC Corrigendum of August 2010 to IEC 61967-6:2002), the following corrections shall be made - the base measurement of the signal line structure shall be changed to 5,2 mm and - the formula for the calibration factor shall be changed in A.4. The responsible Committee is K 631 "Halbleiterbauelemente" ("Semiconductor devices") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.
