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Standards [CURRENT]

BS ISO 14237
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials

Title (German)

Chemische Oberflächenanalyse. Sekundärionenmassenspektrometrie. Bestimmung des Elementgehalts von Bor in Silizium unter Verwendung gleichförmig dotierter Materialien

Edition 2010-08-31
Original language English
Price from 267.20 €
Table of contents