Standards
[CURRENT]
DIN EN 62416
DIN EN 62416
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010
Title (German)
Halbleiterbauelemente - Hot-Carrier-Prüfverfahren für MOS-Transistoren (IEC 62416:2010); Deutsche Fassung EN 62416:2010
Overview
This document specifies a wafer level (Hot carrier) test for "hot" carriers on NMOS and PMOS transistors. The test has been prepared to determine whether the single transistors in a certain ©MOS process meet the required hot carrier lifetime. The responsible Committee is K 631 "Halbleiterbauelemente" ("Semiconductor devices") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.
