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Standards [CURRENT]

NF X21-064 ; NF ISO 23830:2009-02-01
Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Title (German)

Chemische Analytik an Oberflächen - Sekundärionenmassenspektromtrie - Wiederholpräzision und Konstanz der relativen Intensitätsskala bei der statischen Sekundärionenmassenspektromtrie

Edition 2009-02-01
Original language French
Price from 77.20 €
Table of contents