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Standards [CURRENT]

NF C96-022-37 ; NF EN 60749-37:2008-07-01
Semiconductor devices - Mechanical and climatic test methods - Part 37: board level drop test method using an accelerometer

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 37: Prüfverfahren Fall der Leiterplatte unter Verwendung eines Beschleunigungs-Messgerätes

Edition 2008-07-01
Original language French
Price from 105.40 €
Table of contents