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Standards [CURRENT]

BS EN 60749-38
Semiconductor devices - Mechanical and climatic test methods - Soft error test method for semiconductor devices with memory

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Soft-Error-Prüfverfahren für Halbleiterbauelemente mit Speicher

Edition 2008-06-30
Original language English
Price from 192.70 €
Table of contents