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Standards [CURRENT]

FD X21-063 ; FD ISO/TR 22335:2008-06-01
Surface chemical analysis - Depth profiling - Measurement of sputtering rate : mesh-replica method using a mechanical stylus profilometer

Title (German)

Chemische Analytik an Oberflächen - Tiefenprofilanalyse - Messung der Ionenstrahlzerstäubungs-Geschwindigkeit mittels der Gitter-Kopiermethode mit dem mechanischen Stylus Profilometer

Edition 2008-06-01
Original language French
Price from 77.20 €
Table of contents