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Standards [CURRENT]

DIN EN 60749-38
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 38: Soft-Error-Prüfverfahren für Halbleiterbauelemente mit Speicher (IEC 60749-38:2008); Deutsche Fassung EN 60749-38:2008

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Responsible international committee

IEC/TC 47 - Semiconductor devices  

Edition 2008-10
Original language German
Price from 63.80 €
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Table of contents

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