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Standards [CURRENT]

NF X21-062 ; NF ISO 14606:2008-04-01
Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials

Title (German)

Chemische Analytik an Oberflächen - Tiefenprofilanalyse mit Ionenstrahlzerstäubung - Optimierung mit Hilfe von Referenzschichtsystemen

Edition 2008-04-01
Original language French
Price from 77.20 €
Table of contents