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Hydrogen Technologies Standards form the basic framework for market ramp-up
More information
Climate change Standards and specifications support climate targets
More information
Smart Farming Standards and specifications are drivers for the digitalization of agriculture
More information

Standards [CURRENT]

NF C96-017 ; NF EN 62374:2008-01-01
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films

Title (German)

Halbleiterbauelemente - Prüfung des zeitabhängigen dielektrischen Durchbruchs (TDDB) für dielektrische Gate-Schichten

Edition 2008-01-01

Original language French

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Terminology

Hydrogen Technologies Standards form the basic framework for market ramp-up

Climate change Standards and specifications support climate targets

Smart Farming Standards and specifications are drivers for the digitalization of agriculture

NF C96-017 ; NF EN 62374:2008-01-01 Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films

Want to learn more?

NF C96-017 ; NF EN 62374:2008-01-01
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films