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Hydrogen Technologies Standards form the basic framework for market ramp-up
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Climate change Standards and specifications support climate targets
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Smart Farming Standards and specifications are drivers for the digitalization of agriculture
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Projects of DKE/K 631

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IEC 47/1987/DC	2008-08-22	Maintenance of IEC 60747-1 Ed. 2.0: Semiconductor devices - Part 1: General More	Comment
IEC 47F/4/NP	2008-08-22	Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (Future IEC 62047-10) More	Comment
IEC 47F/5/NP	2008-08-22	Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for linear thermal expansion coefficients of MEMS materials (Future IEC 62047-11) More	Comment
IEC 47A/797/DC	2008-08-15	Proposed a new convenor of WG 9 (Test procedures and measurement methods for EMC in integrated circuits) of IEC SC 47A More	Comment
IEC 47A/835/CDV	2008-06-13	IEC 61967-8 Ed.1: Integrated Circuits Measurement of Electromagnetic Emissions Part 8: Measurement of radiated emissions - IC stripline method More	Comment
IEC 47A/863/CDV	2008-06-13	IEC 62132-8 Ed.1: Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method More	Comment
IEC 47/2052/CDV	2008-05-09	IEC 60749-40 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge More	Comment
IEC 47/1973/NP	2008-05-09	PNW 47-1973: Transmission line pulse measurement of human body model parameters for electrostatic discharge protection design of semiconductor devices More	Comment
IEC 47/1967/DC	2008-04-04	Proposed transfer of Technical Report, IEC/TR 62380 Ed. 1, to IEC/TC 56 (Dependability) More	Comment
IEC 110/134/NP	2008-02-15	Proposal of Korean NC: Measurement methods of LED backlight unit for liquid crystal displays More	Comment

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