• Hydrogen Technologies Standards form the basic framework for market ramp-up

    More information

  • Climate change Standards and specifications support climate targets

    More information

  • Smart Farming Standards and specifications are drivers for the digitalization of agriculture

    More information
 

Publications of DKE/K 631

DIN EN 61967-6 Berichtigung 1 2011-02 Standards Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:2008-10; (IEC-Cor. :2010 to IEC 61967-6:2002) More  Order from DIN Media
DIN EN 62047-1 2016-12 Standards Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (IEC 62047-1:2016); German version EN 62047-1:2016 More  Order from DIN Media
DIN EN 62047-2 2007-02 Standards Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006); German version EN 62047-2:2006 More  Order from DIN Media
DIN EN 62047-3 2007-02 Standards Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile-testing (IEC 62047-3:2006); German version EN 62047-3:2006 More  Order from DIN Media
DIN EN 62047-4 2011-03 Standards Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 62047-4:2008); German version EN 62047-4:2010 More  Order from DIN Media
DIN EN 62047-5 2012-03 Standards Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches (IEC 62047-5:2011); German version EN 62047-5:2011 More  Order from DIN Media
DIN EN 62047-6 2010-07 Standards Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009); German version EN 62047-6:2010 More  Order from DIN Media
DIN EN 62047-7 2012-02 Standards Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection (IEC 62047-7:2011); German version EN 62047-7:2011 More  Order from DIN Media
DIN EN 62047-8 2011-12 Standards Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 62047-8:2011); German version EN 62047-8:2011 More  Order from DIN Media
DIN EN 62047-9 2012-03 Standards Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 62047-9:2011); German version EN 62047-9:2011 More  Order from DIN Media

TOP