• Hydrogen Technologies Standards form the basic framework for market ramp-up

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  • Climate change Standards and specifications support climate targets

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  • Smart Farming Standards and specifications are drivers for the digitalization of agriculture

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Publications of DKE/K 631

DIN EN 60749-40 2012-02 Standards Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 60749-40:2011); German version EN 60749-40:2011 More  Order from DIN Media
DIN EN 60749-42 2015-05 Standards Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (IEC 60749-42:2014); German version EN 60749-42:2014 More  Order from DIN Media
DIN EN 60749-44 2017-04 Standards Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016 More  Order from DIN Media
DIN EN 60821 1994-09 Standards IEC-821-VMEbus - Microprocessor system bus for 1 byte to 4 byte data (IEC 60821:1991, modified); German version EN 60821:1994 More  Order from DIN Media
DIN EN 61751 1998-11 Standards Laser modules used for telecommunication - Reliability assessment (IEC 61751:1998); German version EN 61751:1998 More  Order from DIN Media
DIN EN 61943 2001-10 Standards Integrated circuits - Manufacturing line approval application guideline (IEC 61943:1999); German version EN 61943:1999 More  Order from DIN Media
DIN EN 61964 2000-01 Standards Integrated circuits - Memory devices pin configurations (IEC 61964:1999); German version EN 61964:1999 More  Order from DIN Media
DIN EN 61967-2 2006-03 Standards Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (IEC 61967-2:2005); German version EN 61967-2:2005 More  Order from DIN Media
DIN EN 61967-5 2003-10 Standards Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions; Workbench Faraday Cage method (IEC 61967-5:2003); German version EN 61967-5:2003 More  Order from DIN Media
DIN EN 61967-6 2008-10 Standards Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008 More  Order from DIN Media

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