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Publications of DKE/K 631

DIN EN IEC 60749-20 2023-07 Standards Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020); German version EN IEC 60749-20:2020 More  Order from DIN Media
DIN EN IEC 60749-20-1 2018-11 Draft standard Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 47/2488/CDV:2018); German and English version prEN IEC 60749-20-1:2018 More  Order from DIN Media
DIN EN IEC 60749-26 ; VDE 0884-749-26 2018-10 Standards Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018 More  Order from DIN Media
DIN EN IEC 60749-28 ; VDE 0884-749-28:2024-12 2024-12 Standards Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022 More  Order from DIN Media
DIN EN IEC 60749-30 2023-02 Standards Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020 More  Order from DIN Media
DIN EN IEC 60749-34-1 2024-08 Draft standard Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 47/2759/CD:2022); Text in German and English More  Order from DIN Media
DIN EN IEC 60749-37 2023-12 Standards Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022 More  Order from DIN Media
DIN EN IEC 60749-39 2023-10 Standards Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2021); German version EN IEC 60749-39:2022 More  Order from DIN Media
DIN EN IEC 60749-41 2023-03 Standards Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020 More  Order from DIN Media
DIN EN IEC 61967-1 ; VDE 0847-21-1:2019-09 2019-09 Standards Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (IEC 61967-1:2018); German version EN IEC 61967-1:2019 More  Order from DIN Media

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