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Hydrogen Technologies Standards form the basic framework for market ramp-up
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Climate change Standards and specifications support climate targets
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Smart Farming Standards and specifications are drivers for the digitalization of agriculture
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Publications of NA 062-08-16 AA

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ISO 23124	2024-04	Standards	Surface chemical analysis - Measurement of lateral and axial resolutions of a Raman microscope More	Order from DIN Media
ISO 23170	2022-06	Standards	Surface chemical analysis - Depth profiling - Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering More	Order from DIN Media
ISO 23729	2022-07	Standards	Surface chemical analysis - Atomic force microscopy - Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size More	Order from DIN Media
ISO 23812	2009-04	Standards	Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials More	Order from DIN Media
ISO 23830	2008-11	Standards	Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry More	Order from DIN Media
ISO 24236	2005-04	Standards	Surface chemical analysis - Auger electron spectroscopy - Repeatability and constancy of intensity scale More	Order from DIN Media
ISO 24237	2005-06	Standards	Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale More	Order from DIN Media
ISO 24417	2022-09	Standards	Surface chemical analysis - Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry More	Order from DIN Media
ISO 24465	2023-01	Standards	Surface chemical analysis - Determination of the minimum detectability of surface plasmon resonance device More	Order from DIN Media
ISO 27911	2011-08	Standards	Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope More	Order from DIN Media

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