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Hydrogen Technologies Standards form the basic framework for market ramp-up
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Smart Farming Standards and specifications are drivers for the digitalization of agriculture
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Publications of NA 062-08-16 AA

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ISO 15470	2017-03	Standards	Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters More	Order from DIN Media
ISO 15471	2016-09	Standards	Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters More	Order from DIN Media
ISO 15472	2010-05	Standards	Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales More	Order from DIN Media
ISO 16129	2018-11	Standards	Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer More	Order from DIN Media
ISO 16242	2011-12	Standards	Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES) More	Order from DIN Media
ISO 16243	2011-12	Standards	Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS) More	Order from DIN Media
ISO 16413	2020-08	Standards	Evaluation of thickness, density and interface width of thin films by X-ray reflectometry - Instrumental requirements, alignment and positioning, data collection, data analysis and reporting More	Order from DIN Media
ISO 16531	2020-10	Standards	Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS More	Order from DIN Media
ISO 16962	2017-02	Standards	Surface chemical analysis - Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry More	Order from DIN Media
ISO 17109	2022-03	Standards	Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films More	Order from DIN Media

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