• Hydrogen Technologies Standards form the basic framework for market ramp-up

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  • Climate change Standards and specifications support climate targets

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  • Smart Farming Standards and specifications are drivers for the digitalization of agriculture

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Publications of NA 062-08-18 AA

ISO 13067 2020-07 Standards Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size More  Order from DIN Media
ISO 14595 2023-06 Standards Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs) More  Order from DIN Media
ISO 15632 2021-02 Standards Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) More  Order from DIN Media
ISO 15932 2013-12 Standards Microbeam analysis - Analytical electron microscopy - Vocabulary More  Order from DIN Media
ISO 16592 2012-08 Standards Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method More  Order from DIN Media
ISO 16700 2016-08 Standards Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification More  Order from DIN Media
ISO 17470 2014-01 Standards Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry More  Order from DIN Media
ISO 19214 2024-10 Standards Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy More  Order from DIN Media
ISO 19463 2018-07 Standards Microbeam analysis - Electron probe microanalyser (EPMA) - Guidelines for performing quality assurance procedures More  Order from DIN Media
ISO 20263 2024-11 Standards Microbeam analysis - Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials More  Order from DIN Media

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