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IEC 47F/70/CDV
IEC 62047-14 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
IEC CIS/A/1007/CDV
Amendment 1 to CISPR 16-4-2: Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-2: Uncertainties, statistics and limit modelling - Measurement instrumentation uncertainty
IEC CIS/I/7/DC
Proposed amendment to CISPR 22 to consider the limit for equipment with broadband emissions
ISO/DIS 11929-1
Determination of the characteristic limits (decision threshold, detection limit and limits of the coverage interval) for measurements of ionizing radiation - Fundamentals and application - Part 1: Elementary applications
ISO/DIS 11929-2
Determination of the characteristic limits (decision threshold, detection limit and limits of the coverage interval) for measurements of ionizing radiation - Fundamentals and application - Part 2: Advanced applications
ISO/DIS 11929-3
Determination of the characteristic limits (decision threshold, detection limit and limits of the coverage interval) for measurements of ionizing radiation - Fundamentals and application - Part 3: Applications to unfolding methods
IEC/CIS/I/WG 1
Methods of measurement and limits for radiation and immunity of broadcast receivers and associated equipment (Maintenance of CISPR 13 and 20)
IEC/CIS/I/WG 2
Methods of measurements and limits for emissions from multimedia equipment
IEC/TC 20/WG 19
Current rating and short-circuuit limits of cables
IEC/CIS/I/PT CISPR 22-PLT
Limits and method of mesurement of broadband telecommunication equipment over power lines
