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DIN EN IEC 63448
Low and Ultra-low Latency Communication and Control Systems
CEN/WS QaR
The QaR method to measure the extreme risk of re-identification of a database in the context of assessing its insurability
DIN EN IEC 63567-1
Semiconductor devices Performance evaluation of semiconductor components and equipment - Part 1: Transmittance evaluation method of EUV pellicle
DIN EN IEC 62788-5-1
Measurement procedures for materials used in photovoltaic modules - Part 5-1: Edge seals - Suggested test methods for use with edge seal materials (IEC 62788-5-1:2019); English version EN IEC 62788-5-1:2020
