Search results

Search list

Results in:

1-10 of 22 results

Aerospace series - Cable outlet accessories for circular and rectangular electrical and optical connectors - Part 033: Stainless steel banding band, style Z, for attachment of individual and/or overall screens to cable outlets - Product standard; German version ASD-STAN prEN 3660-033:2023

Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices (IEC 47E/812/CDV:2023); German and English version prEN IEC 60747-15:2023

Microbiology of the food chain - Method validation - Part 3: Protocol for the verification of reference methods and validated alternative methods in a single laboratory - Amendment 1: Validated identification methods of microorganisms (ISO 16140-3:2021/DAM 1:2024); German and English version EN ISO 16140-3:2021/prA1:2024

Microbiology of the food chain - Method validation - Part 4: Protocol for method validation in a single laboratory - Amendment 2: Protocol for single-laboratory validation of identification methods of microorganisms (ISO 16140-4:2020/DAM 2:2024); German and English version EN ISO 16140-4:2020/prA2:2024

Microbiology of the food chain - Method validation - Part 3: Protocol for the verification of reference methods and validated alternative methods in a single laboratory - Amendment 1: Verification of validated identification methods

Microbiology of the food chain - Method validation - Part 4: Protocol for method validation in a single laboratory - Amendment 2: Protocol for single-laboratory validation of identification methods of microorganisms

Microbiology of the food chain - Method validation - Part 3: Protocol for the verification of reference methods and validated alternative methods in a single laboratory - Amendment 1: Validated identification methods of microorganisms - Technical protocol for verification

Committees

IEC/SC 47E

Discrete semiconductor devices

Committees

DKE/UK 631.1

Einzel-Halbleiterbauelemente

Calibration and Quantification of the SPECT/CT - Part 201: Calibration of the SPECT/CT for Lu-177

TOP