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DIN EN 3660-033
Aerospace series - Cable outlet accessories for circular and rectangular electrical and optical connectors - Part 033: Stainless steel banding band, style Z, for attachment of individual and/or overall screens to cable outlets - Product standard; German version ASD-STAN prEN 3660-033:2023
DIN EN IEC 60747-15
Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices (IEC 47E/812/CDV:2023); German and English version prEN IEC 60747-15:2023
DIN EN ISO 16140-3/A1
Microbiology of the food chain - Method validation - Part 3: Protocol for the verification of reference methods and validated alternative methods in a single laboratory - Amendment 1: Validated identification methods of microorganisms (ISO 16140-3:2021/DAM 1:2024); German and English version EN ISO 16140-3:2021/prA1:2024
DIN EN ISO 16140-4/A2
Microbiology of the food chain - Method validation - Part 4: Protocol for method validation in a single laboratory - Amendment 2: Protocol for single-laboratory validation of identification methods of microorganisms (ISO 16140-4:2020/DAM 2:2024); German and English version EN ISO 16140-4:2020/prA2:2024
EN ISO 16140-3/prA1
Microbiology of the food chain - Method validation - Part 3: Protocol for the verification of reference methods and validated alternative methods in a single laboratory - Amendment 1: Verification of validated identification methods
EN ISO 16140-4/prA2
Microbiology of the food chain - Method validation - Part 4: Protocol for method validation in a single laboratory - Amendment 2: Protocol for single-laboratory validation of identification methods of microorganisms
ISO 16140-3 DAM 1
Microbiology of the food chain - Method validation - Part 3: Protocol for the verification of reference methods and validated alternative methods in a single laboratory - Amendment 1: Validated identification methods of microorganisms - Technical protocol for verification
IEC/SC 47E
Discrete semiconductor devices
DKE/UK 631.1
Einzel-Halbleiterbauelemente
DIN 6858-201
Calibration and Quantification of the SPECT/CT - Part 201: Calibration of the SPECT/CT for Lu-177