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Integrated circuits - Three dimensional integrated circuits - Part 3: A model and measurement conditions of through silicon via (IEC 47A/997/CD:2016)

Threedimensional radiological pictures

Steels - Micrographic determination of the apparent grain size (ISO 643:2024); German version EN ISO 643:2024

Optics and photonics - Preparation of drawings for optical elements and systems - Part 16: Diffractive surfaces (ISO 10110-16:2023)

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