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IEC 45B/650/CD
IEC 61275 Ed.2: Radiation protection instrumentation - Measurement of discrete radionuclides in the environment - In situ photon spectrometry system using a germanium detector
IEC 46A/362/NP
Proposal of the German NC: Pulse/Step Return Loss from measurement in the frequency domain using the Inverse Discrete Fourier Transformation (IDFT)
IEC 46A/DE1/NP
Pulse/Step Return Loss from measurement in the frequency domain using the Inverse Discrete Fourier Transformation (IDFT)
IEC 47C/173/FDIS
Amendment 3 to IEC 60747-5: Semiconductor devices - Discrete devices and integrated circuits - Part 5: Optoelectronic devices
IEC 47E/119/CDV
IEC 60747-4: Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors - Integrated circuit microwave frequency prescalers
IEC 47E/179/NP
Semiconductor devices, Discrete devices, Semiconductor Flow Sensor
IEC 47E/293/NP
(Future IEC 60747-14-5): Discrete semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
IEC 47E/299/NP
(Future IEC 60747-14-6): Semiconductor devices - Discrete Devices - Part 14-6: Semiconductor sensors Test method of CMOS imagesensor module
IEC 47E/328/NP
(Future IEC 60747-14-x): Semiconductor devices - Discrete devices - Part 14-x: Semiconductor sensors - Test method of CMOS image sensor module
IEC 47E/329/NP
(Future IEC 60747-14-7): Semiconductor devices - Discrete devices - Part 14-7: Semiconductor sensors - Humidity
