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IEC 47D/576/NP

Proposed IEC 60191-6-xx: Glossary of semiconductor test and burn-in socket for BGA, LGA, FBGA and FLGA

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DIN IEC 60749-23

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

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IEC 47D/576/NP

DIN IEC 60749-23