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IEC 62643-1 Ed.1: ELECTROSTATIC MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) OSCILLATORSOF ASSESSED QUALITY - Part 1: Generic specification

IEC 62575-2 Ed.1 : Radio Frequency (RF) Bulk Acoustic Wave (BAW) Filters of Assessed Quality - Part 2 :Guide to the use

Proposal of JPNC: Surface acoustic wave oscillators of assessed quality - Part 1: Generic specification

IEC 60679-1, Ed.2: Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

IEC 60862-2 Ed.3: Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guide to the use

IEC 60679-1 Ed.4 : Piezoelectric and associated material oscillators of assessed quality - Part 1 : Generic specification

IEC 60862-1 Ed.3: Surface acoustic wave (saw) filters of assessed quality - Part 1: Generic specification

Amendment 1 to IEC 60122-1 Ed.3 : Quartz crystal units of assessed quality - Part 1: Generic specification

Amendment to IEC 60679-1 Ed.3 : Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

Future IEC 62575-1 Ed.1 : Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part I Generic specification

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