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Project

IEC 47F/95/NP

Future IEC 62047-21: Semiconductor devices - Micro-electromechanical devices Part 21: Test method for Poisson's ratio of thin film MEMS materials

Project

IEC 47F/127/CD

IEC 62047-21 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials

Project

IEC 47F/147A/CDV

IEC 62047-21 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials

Project

ISO/CD 11843-6

Capability of detection - Part 6: Methodology for the determination of the critical value and the minimum detectable value in Poisson distributed measurements by normal approximations

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