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Semiconductor devices - Mechanical and climatic test methods - Part 22-1: Bond strength - wire bond pull test methods

Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods

Environmental solid matrices - Determination of elemental composition by X-ray fluorescence spectrometry (ISO/DIS 18227:2024); German and English version prEN ISO 18227:2024

Water quality - Radium-226 - Part 3: Test method using coprecipitation and gamma-spectrometry (ISO/FDIS 13165-3:2024)

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