Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-ICP-OES)

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by optical emission spectrometry by direct current arc excitation (DCArc-OES)

IEC 61837-2 Ed.2: Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

Draft revision of IEC 60233: Ceramic and glass hollow insulators for use in electrical equipment with nominal voltages greater than 1000 V

Insulators for overhead lines with a nominal voltage above 1000 V - Ceramic or glass insulator units for d.c. systems - Definitions, test methods and acceptance criteria

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-ICP-OES); German and English version prEN 15991:2024

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by optical emission spectrometry by direct current arc excitation (DCArc-OES); German and English version prEN 15979:2024

IEC 60507/Ed. 1: Artificial pollution tests on high-voltage ceramic and glass insulators to be used on a.c. systems

Amendment 2 to IEC 60384-10 (1989): Fixed capacitors for use in electronic equipment - Part 10: Sectional specification: Fixed multilayer ceramic chip capacitors

Insulators for overhead lines with a nominal voltage above 1000 V - Residual strength test for ceramic or glass string insulator units after mechanical damage of the dielectric