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IEC 38/393/NP
Future IEC 61869-11: Instrument Transformers - Part 11: Low power stand alone voltage sensors
IEC 38/396A/NP
Comments received on 38/396/NP: Future IEC 61869-9: Instrument Transformers - Part 9: Digital Interface for Instrument Transformers
IEC 38/397/NP
Future IEC 61869-13: Instrument Transformers - Part 13: Standalone Merging Unit
IEC 38/397A/NP
Comments received on Future IEC 61869-13: Instrument Transformers - Part 13: Standalone Merging Unit
IEC 42/280/NP
Future IEC 61083-3 Ed. 1.0: Instruments and software used for measurements in high-voltage and high-current tests - Part 3: Requirements for instruments for tests with alternating and direct currents and voltages - "Proposed Horizontal Standard"
IEC 42/291/NP
Future IEC 62478 Ed. 1.0: High voltage test techniques - Measurement of partial discharges by electromagnetic and acoustic methods "Proposed Horizontal Standard"
IEC 47/1868/NP
(Future IEC 62047-6): Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
IEC 47/1905/NP
Proposal of the Korean NC: (Future IEC 62047-7): Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS FBAR Filter & Duplexer
IEC 47/1906/NP
Proposal of the Korean NC: (Future IEC 62047-8): Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
IEC 47/1907/NP
Proposal of the Korean NC: (Future IEC 62047-9): Semiconductor devices - Micro-electromechanical devices - Part 9: Bonding strength measurement in MEMS packaging
