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DIN EN IEC 63567-1
Semiconductor devices Performance evaluation of semiconductor components and equipment - Part 1: Transmittance evaluation method of EUV pellicle
DIN EN IEC 63578
Electrolyte for vanadium flow batteries
DIN EN IEC 63580
Measuring equipment for electrical and electromagnetic quantities - Environmental aspects
DIN EN IEC 63581-1
The recognition criteria of defects in polished indium phosphide wafers - Part 1: Classification of defects
DIN EN IEC 63584
Open Charge Point Protocol (OCPP)
DIN EN IEC 63585
Interpretation of Dissolved Gas Analysis in natural and synthetic esters
DIN EN IEC 63591
General method for assessing the proportion of recycled materials content in products
DIN EN IEC 63598
Direct current (DC) plugs, socket-outlets, ship connectors and ship inlets for low-voltage shore connection systems (LVSC)
DIN EN IEC 63600
Evaluation of hydrophobicity retention of polymeric insulating materials under high voltage stress with the dynamic drop test
DIN EN IEC 63609-1
Measurement method used in thermal design for electronics assemblies - Part 1: Measurement requirements used in thermal design for the circuit boards or assemblies with miniaturized SMDs where the heat dissipation path to the board is dominant
