Fibre optic interconnecting devices and passive components - Fibre optic connector multimode optical interfaces - Part 2-2: Connection of 50 µm core diameter multimode physically contacting fibres - Non-angled and angled for reference connector application, at wavelength of 850 nm using IEC 60793-2-10 selected A1-OM2b to A1-OM5b fibre only (IEC 86B/4607/CD:2022); Text in German and English

Fibre optic interconnecting devices and passive components - Fibre optic connector optical interfaces for enhanced macrobend multimode fibres - Part 3-61: Connector parameters of physically contacting 50 µm core diameter fibres - Non-angled 2,5 mm and 1,25 mm diameter cylindrical full zirconia ferrules for reference connection applications (IEC 86B/4836/CDV:2024); German and English version prEN IEC 63267-3-61:2024

Fibre optic interconnecting devices and passive components - Connector optical interfaces for enhanced Macro bend multimode fibre - Part 3-81: Connector parameters of physically contacting 50 µm core diameter fibres - Non-angled polyphenylene sulphide rectangular ferrules with a single row of 12, 8, 4, or 2 fibres for reference connector applications (IEC 86B/4837/CDV:2024); German and English version prEN IEC 63267-3-81:2024

Industrial automation equipment and systems - Predictive maintenance (IEC 65E/877/CD:2022); Text in German and English

Asset administration shell for industrial application - Part 4: Use cases and modelling examples

Automation engineering of modular systems in the process industry - General concept and interface

Autonomous drive cargo e-transporters - General requirements and test methods

E-Transporters - Part 3-1: Performance test method for total run time of e-scooters with consideration to environmental conditions of actual use (IEC 63281-3-1:2024); German version EN IEC 63281-3-1:2024

Energy Storage Power Converter (ESPC) Sub-System for use in Electrical Energy Storage Systems (EESS) - Part 3: Method of specifying the performance and test requirements (IEC 22H/302/CD:2022); Text in German and English

Semiconductor devices - Guidelines for reliability qualification plans - Part 4: Early failure assessment