Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 47/2759/CD:2022); Text in German and English

Optical fibres - Part 1-22: Measurement methods and test procedures - Length measurement (IEC 86A/2335/CDV:2023); German and English version prEN IEC 60793-1-22:2023

Optical fibres - Part 1-40: Attenuation measurement methods (IEC 86A/2355/CDV:2023); German and English version prEN IEC 60793-1-40:2023

Optical fibres - Part 1-41: Measurement methods and test procedures - Bandwidth (IEC 86A/2218/CD:2022); Text in German and English

Optical fibres - Part 1-45: Measurement methods and test procedures - Mode field diameter (IEC 86A/2219/CD:2022); Text in German and English

Optical fibres - Part 1-46: Measurement methods and test procedures - Monitoring of changes in optical attenuation (IEC 86A/2334/CDV:2023); German and English version prEN IEC 60793-1-46:2023

Optical fibres - Part 2-50: Product specifications - Sectional specification for class B single-mode fibres (IEC 86A/2301/CDV:2023); German and English version prEN IEC 60793-2-50:2023

Optical fibres - Part 2-60: Product specifications - Sectional specification for category C single-mode interconnection fibres (IEC 86A/2470/CDV:2024); German and English version prEN IEC 60793-2-60:2024