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IEC 47/2155/CDV
IEC 60749-28 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM)
IEC 47F/156/FDIS
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
IEC 48B/598/FDIS
Draft IEC 60512-1-4: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d - Contact protection effectiveness (scoop-proof)
IEC 48B/913/DC
Proposed corrigendum to IEC 60512-1-4 (issued in 1997)
IEC 48B/1431/CD
60512-25-1 Ed. 2: CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - Part 25-1: Test 25a - Crosstalk ratio
IEC 48B/2210/CDV
IEC 60512-16-21 Ed 1.0: Connectors for electronic equipment - tests and measurements - Part 16-21: Test 16u: Whisker test via the application of external mechanical stresses
IEC 64/1185/CD
IEC 60364-6-62: Electrical installations of buildings - Part 6-62 : Verification - Periodic inspection and testing
IEC 77B/295/CDV
Amendment to IEC 61000-4-3 - Annex D: Other test methods - TEM cells and striplines
IEC 77B/643/CDV
IEC 61000-4-4 Ed.3: Electromagnetic compatibility (EMC) - Part 4-4:Testing and measurement techniques - Electrical fast transient/burst immunity test
IEC 82/606/CDV
IEC 61853-2 Ed.1: Photovoltaic (PV) module performance testing and energy rating - Part 2: Spectral response, incidence angle and module operating temperature measurements
