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IEC 46F/35/DC
Maintenance programme - Call for comments/proposals for amendment/revision of IEC 60169-4
IEC 47/1394/FDIS
Amendment 3 to IEC 749: Withdrawal of tests Db and Z/AD
IEC 47/1423/CDV
Amendment to the IEV Chapter 521: Semiconductor devices and integrated circuits
IEC 47A/403/CDV
Proposal for amendment to Draft IEC 748-5- Chapter V: Acceptance and reliability
IEC 47C/173/FDIS
Amendment 3 to IEC 60747-5: Semiconductor devices - Discrete devices and integrated circuits - Part 5: Optoelectronic devices
IEC 47E/100/NP
Proposal of the Chinese NC: Amendment to IEC 60747-9: IGBTs
IEC 47E/160/FDIS
Amendment 3 to IEC 60747-4, ed.1
IEC 48B/699/NP
Proposal of the German NC: Amendment 2 to IEC 60352-2: Solderless connections - Part 2: Solderless crimped connections - General requirements, test methods and practical guidance
IEC 48B/2049/DC
Proposed Amendment to IEC 60603-7 series standards
IEC 49/841/DC
Consideration of the maintenance work of WG1 and WG6: Amendment of IEC 60122-1 Ed.3 Quartz crystal units of assessed quality - Part 1: Generic specification
