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IEC 47A/862/CD
IEC 62132-6 Ed.1: Integrated circuits - Measurement ofelectromagnetic immunity - Part 6: Local Injection Horn Antenna (LIHA) method
IEC 47A/863/CDV
IEC 62132-8 Ed.1: Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method
IEC 46/428/CDV
EC 62153-4-3/Ed. 2: Metallic communication cable test methods - Part 4-3: Electromagnetic Compatibility (EMC) - Surface transfer impedance - Triaxial method
IEC 47A/881/CDV
IEC 62215-3 Ed.1: Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
IEC 78/779/DC
Maintenance of IEC 61472: Live working -live working - Minimum approach distances for a.c. systems in the voltage range 72,5 kV to 800 kV - A method of calculation
IEC CIS/B/499/RR
Review report on CISPR TR 19: Guidance on the use of the substitution method for measurements of radiation from microwave ovens for frequencies above 1 GHz
IEC CIS/A/932/CDV
CISPR 16-1-4 Amd.1 Ed.3: Introduction of Reference Site method (RSM)
IEC 47F/38/NP
(Future IEC 62047-15): Semiconductor devices -Micro-electromechanical devices - Part 15: Test method for bond strength in PDMS/Glass chip
IEC 47F/39/NP
(Future IEC 62047-16): Semiconductor devices -Micro-electromechanical devices - Part 16: Test method forresidual stress measurement
IEC 47F/46/NP
(Future IEC 62047-17): Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
