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IEC 46F/73/NP
Cavity Resonator Method to Measure the Complex Permittivity of Low-Loss Dielectric Plate (NPPAS)
IEC 47E/328/NP
(Future IEC 60747-14-x): Semiconductor devices - Discrete devices - Part 14-x: Semiconductor sensors - Test method of CMOS image sensor module
IEC 49/777/NP
Waveguide type dielectric resonators, General information and test conditions - Measurement method of conductivity at interface between conductor and dielectric material at microwave frequency
IEC 15A/108/CD
IEC 61622, Ed.2: Test method for water adsorbtion characteristics of insulating material surfaces - Part 1: Printed circuit boards
IEC 15E/21/CD
IEC 61622, Ed.2: Test method for water adsorbtion characteristics of insulating material surfaces - Part 1: Printed circuit boards
IEC 20C/41/CDV
Amendment No. 1 to IEC 754-2: To introduce a simplified method of expressing the results of tests
IEC 50/358/FDIS
IEC 68-2-69: Solderability testing of electronic components for surface mount technology by the wetting balance method
IEC CIS/I/257A/CD
CISPR 22 A3 f1 Ed. 5.0: Limits and method of measurement of broadband telecommunication equipment over power lines (This CD has been withdrawn)
IEC CIS/I/26/DC
Proposed amendment to CISPR 22 to clarify its application to telecommunication systems with regard to the method of disturbance measurement at ITE ports used for PLC
IEC 89/1002/CD
IEC 60695-6-30 TS Ed1.0: Fire hazard testing - Part 6-30: Smoke obscuration - Small scale static method - Apparatus
