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IEC 49/833/NP
Proposal of JPNC: Surface acoustic wave oscillators of assessed quality - Part 1: Generic specification
IEC 49/841/DC
Consideration of the maintenance work of WG1 and WG6: Amendment of IEC 60122-1 Ed.3 Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 49/842/DC
Consideration of the maintenance work of WG1, WG6 and WG 7: Amendment of IEC 60679-1 Ed.3 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
IEC 49/850/NP
Proposal of Japanese NC: Electrostatic Micro Electro Mechanical Systems (MEMS) oscillators of assembled quality - Part 1 : Generic specification
IEC 49/939/CD
IEC 62643-1 Ed.1: ELECTROSTATIC MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) OSCILLATORSOF ASSESSED QUALITY - Part 1: Generic specification
IEC 49/961/NP
Surface Acoustic Wave (SAW) Controlled Oscillators Using SAW Resonators and SAW Delay Lines - Part 1: Generic specification
IEC 49/962/NP
Future IEC 62604-1 Ed.1.0: Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers - Part 1: Generic specification
IEC 49/984/NP
Future IEC 62575-1 Ed.1 : Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part I Generic specification
IEC 49/993/CD
IEC 62604-1 Ed.1: Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
IEC 49/998/CD
IEC 62575-1 Ed.1: Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
