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IEC 47E/328/NP
(Future IEC 60747-14-x): Semiconductor devices - Discrete devices - Part 14-x: Semiconductor sensors - Test method of CMOS image sensor module
IEC 47E/329/NP
(Future IEC 60747-14-7): Semiconductor devices - Discrete devices - Part 14-7: Semiconductor sensors - Humidity
IEC 47E/342/NP
Proposal of the Japanese NC: (Future IEC 60747-16-5): Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
IEC 47E/352/NP
Proposal of the German NC: (Future IEC 60747-x-y): Semiconductor devices - Magnetic and capacitive coupler for safe isolation
IEC 47E/399/RR
Review report on IEC 60747-5-5 Ed.1: Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices -Photocouplers
IEC 47E/413/NP
Future IEC 60747-17 Ed. 1.0: Semiconductor devices - Discrete devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation
IEC 47E/418/CD
IEC 60747-5-6 Ed. 1 : Semiconductor devices - Discrete devices - Part 5-6: Optoelectronic devices - Light emitting diodes
IEC 47E/420/CD
IEC 60747-5-7 Ed.1: Semiconductor devices - Discrete devices - Part 5-7: Photodiodes and phototransistors
IEC 47E/424/NP
Future IEC 60747-14-6: Semiconductor devices - Part 14-6: Semiconductor sensors - Humidity sensor
IEC 47E/425/NP
Future IEC 60747-14-7: Semiconductor devices - Part 14-7: Semiconductor sensors - Flow meter
