Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 47/2759/CD:2022); Text in German and English

Optical fibre cables - Part 1-131: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Microduct inner clearance test, Method E31

Optical fibre cables - Part 1-135: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Sheave test, Method E35

Optical fibre cables - Part 1-214: Generic specification - Basic optical cable test procedures - Environmental test methods - Cable UV resistance test, Method F14 (IEC 86A/2457/CDV:2024); German and English version prEN IEC 60794-1-214:2024

Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including 1000 V - Part 1: General - Performance, testing and rating - Safety requirements - Guide for installation and operation

Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides (IEC 77B/853/FDIS:2021); German and English version FprEN IEC 61000-4-20:2021

Electromagnetic compatibility (EMC) - Part 4-41: Testing and measurement techniques - Broadband radiated immunity tests (IEC 77B/870/CD:2023);

Reliability testing - Compliance test plans for success ratio (IEC 56/1831/CDV:2019); German and English version prEN IEC 61123:2019

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 2-805: X/Y CTE Test for Thin Base Materials by TMA (IEC 91/1696/CD:2020); Text in German and English