Draft IEC 60512-1-4: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d - Contact protection effectiveness (scoop-proof)

Proposed corrigendum to IEC 60512-1-4 (issued in 1997)

60512-25-1 Ed. 2: CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - Part 25-1: Test 25a - Crosstalk ratio

IEC 60512-27-100 Ed 1.0: Connectors for electrical equipment - Tests and measurements - Part 27-100: Signal integrity tests up to 500 mhz on 60603-7 series connectors - Tests 27a to 27g

IEC 60512-16-21 Ed 1.0: Connectors for electronic equipment - tests and measurements - Part 16-21: Test 16u: Whisker test via the application of external mechanical stresses

IEC 62276 Ed.2: Single Crystal Wafers for Surface Acoustic Wave (SAW) devices applications - specicication and measuring method.

Noise suppression sheet for digital devices and equipment - Part 2: Measuring methods (IEC 62333-2:2006)

IEC 61000-4-34: Electromagnetic compatibility (EMC) Part 4-34: Testing and measuring techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current more than 16 A per phase. Basic EMC publication

Amendment to IEC 61000-4-3: Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 3: Radiated, radio-frequency, electromagnetic field immunity test - Annex D: Other test methods - TEM cells and striplines

Amendment to IEC 61000-4-3 - Annex D: Other test methods - TEM cells and striplines