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IEC 47F/105/NP
Future IEC 62047-23: Semiconductor devices - Micro-electromechanical devices - Part 23: Test methods for determining residual stresses of MEMS films; wafer curvature and cantilever beam deflection methods
NA 080-00-06-14 AK
6868-165 Cone-Beam-CT
NA 121-03-12 AA -dormant
Heading Dies, Forming Rolls, Blades for Folding Beam
CEN/TC 72/WG 10
Optical beam smoke detectors
NA 092-00-15 AA
Electron beam welding (DVS AG V 9.1)
NA 092-00-21 AA
Laser beam welding and allied processes (DVS AG V 9.2)
ISO/WD 16887
Microbeam analysis - Analytical electron microscopy - Guidelines of specimen preparation for transmission electron microscope using focused ion beam processing
NA 080-00-06-10 AK
6868-161 Acceptance and constancy testing of dental radiographic equipment for digital cone-beam computed tomography
EN 12854/FprA1
Food processing machinery - Beam mixers - Safety and hygiene requirements
prEN ISO 11670 rev
Lasers and laser-related equipment - Test methods for laser beam parameters - Beam positional stability
