Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method

Future IEC 61338-1-5: Waveguide type dielectric resonators, Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

Future IEC 62326-14: Printed boards - Device Embedded Substrate - Terminology / Reliability / Design Guide

Electrical test method for device embedded substrate - general electrical test guide for device embedded substrate with active devices, passive components (Capacitor, Resistor, Inductor, etc), Integrated passive device (IPD), and discrete packages.

IEC 62326-15: Printed boards - Device Embedded Substrate - General electrical test guide for device embedded substrate with active devices, passive components (Capacitor, Resistor, Inductor, etc), Integrated passive device (IPD), and discrete packages.

Future IEC 62326-16: Printed boards-Device Embedded Substrate-Scope and Definition

Future IEC 62326-17; Printed boards-Device Embedded Substrate-TEG(test element group)

Future IEC 62326-18: Printed boards-Device Embedded Substrate-Test Method

Future IEC 62326-19: Printed boards-Device Embedded Substrate-Design Guide

IEC 62326-15: Printed boards - Part 15: Device Embedded Substrate - General electrical test guide for device embedded substrate with active devices, passive components (Capacitor, Resistor, Inductor, etc), Integrated passive device (IPD), and discrete packages